“SATURATION THICKNESSES FOR SCATTERING BREMSSTRAHLUNG OF ELECTRONS WITH Ee = 13 AND 22 MeV FROM FLAT LEAD TARGETS AND THEIR STATISTICAL PROCESSING OF THE DATA DEPENDENCE” (2026) Multidisciplinary Journal of Science and Technology, 6(5), pp. 143–151. Available at: http://www.mjstjournal.com/index.php/mjst/article/view/7355 (Accessed: 19 May 2026).