SATURATION THICKNESSES FOR SCATTERING BREMSSTRAHLUNG OF ELECTRONS WITH Ee = 13 AND 22 MeV FROM FLAT LEAD TARGETS AND THEIR STATISTICAL PROCESSING OF THE DATA DEPENDENCE. Multidisciplinary Journal of Science and Technology, [S. l.], v. 6, n. 5, p. 143–151, 2026. Disponível em: http://www.mjstjournal.com/index.php/mjst/article/view/7355. Acesso em: 19 may. 2026.